November 2001 Edition, Part Number 370177B-01
Use the Measurements VIs located on the Functions»Analyze»Waveform Measurements, Waveform Conditioning, Waveform Monitoring, and Waveform Generation palettes to perform common time and frequency domain measurements, measure harmonic and noise distortion, perform digital filtering and windowing, analyze the waveforms for trigger points, search for peaks, perform limit mask testing, and generate different types of single and multitone signals and noise.
Use the Signal Processing VIs located on the Functions»Analyze»Signal Processing palette to perform signal generation, digital filtering, frequency domain analysis, time domain analysis, data windowing, and spectrum analysis.
Use the Point By Point VIs located on the Functions»Analyze»Point By Point palette to conveniently and efficiently process data a point at a time.
Use the Mathematics VIs located on the Functions»Analyze»Mathematics palette to perform many different kinds of mathematical calculations.
Use the Waveform VIs and Functions located on the Functions»Waveform palette to build waveforms that include the waveform values, channel information, and timing information.
Mathematics VIs | Waveform Generation VIs |
Point By Point VIs | Waveform Measurements VIs |
Signal Processing VIs | Waveform Monitoring VIs |
Waveform Conditioning VIs |
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